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Standards in Test |
You will be introduced to most of the Military and Commercial Standards that affect the way test is performed and interpreted by both military and commercial concerns.
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The Economics of Test and Testability |
Why test is a solution to an economic problem
How non-technical management views return on investment (ROI) and how to translate technical benefits to these terms
Existing formulas for the cost and benefits of IC, board, and system tests
How behavioral economics applies to test and what we can learn from it.
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The Testability Director |
The Testability Director will enable you to design circuits which are testable. The guidelines are provided as you design and you can evaluate your design's testability before you finalize it and before costs of design changes make testability prohibitive.
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VLSI Simulation and Test Generation |
The stuck-at models used in simple logic is becoming obsolete when we wish to test Very Large Scale Integrated circuits. You will learn new approaches to test that can be used to test highly complex circuits.
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WebCourse - ATE 101 - Overview of Test, ATE & Testability |
A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course.
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WebCourse - ATE 201 - Test Strategy and ATE Mix |
Automatic Test Equipment (ATE) come in many generic forms. They serve different purposes and find different types of faults. In order to cover the types of faults you expect with your product, you need to strategize the types and the extent to which you will use some types of ATEs. This course will help you make these decisions, help you interpret fault data to improve your selections, and teach you how you can improve your allocation of ATE as your product matures and your fault universe changes.
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WebCourse - ATE 301 - ATE Test Programming |
This course will teach you what is involved in developing a test program for an ATE. If you have never written a test program before, the course will illustrate the difficulties and point out traps that can make test programming a nightmare. For those who have experienced these problems, the course will provide a structured approach that will help avoid these problems in the future.
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WebCourse - Design for Testability 101 - Who, What, When, Why, How Much |
You will learn why Design for Testabilty (DFT) is an invaluable method to reduce test development costs. As long as DFT is performed early in the design stage, the return on investment (ROI) is substantial. You will learn how to translate techinical issues involving testability to economic issues understood by non-technical management.
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WebCourse - Design for Testability 201 - Techniques for ICs, Boards and Systems |
You will learn specific Design for Testabilty (DFT) techniques for making your circuit more testable, whether the circuit is an Integrated Circuit, Circuit Board, or a System. This course provides the "How" that was not covered in DFT 101. You will learn easy to apply techniques to circuits that will reap substantial benefits when it comes time to test the circuit.
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WebCourse - Design for Testability 301 - JTAG/Boundary Scan/IEEE 1149.1 |
You will learn the details of Boundary Scan, often called, JTAG and officially called the IEEE-1149.1 standard. While you may have come across this concept, you may still be a bit unsure if you have a clear understanding. In this webinar we look under the hood and you will learn the intricate details of how this technology works.
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WebCourse - Design for Testability 401 - System Level Testability and Diagnosability |
For system level, testability isn't only failure detection. You need to concern yourself with repair and before that can happen, you need to accurately and unambigously determine the root cause of the system failure. That root cause should involve a single replaceable subsystem or board in nearly all cases. You will learn how to approach this in a logical fashion.
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WebCourse - Design for Testability 501 - Advanced DFT Techniques |
Boundary Scan pioneered a new approach to testability for board level. It is, however, important to integrate this with other forms of assembly. For today's complex circuits it may not be sufficient to test the boundary of the IC. Rather we will need to test inside the IC even when the IC is already mounted on a circuit board and when that board is already part of a module or system. This webinar will teach you about newer tools and the integration of those tools with traditional testability approaches.
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