ATE Selection, Design and Programming

What you will learn:

This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.

Abstract:

This course provides a test engineering curriculum. From a quick introduction of ATE, the course goes on to test strategies. Test requirements and test specifications are discussed in detail. Next, the course dissects the ATE and looks closely at Stimulus Measurement, and Switching Instruments. The IEEE 488 (GPIB or HPIB) and the PC bus is introduced and the VXIbus is examined in detail. The course also covers, PXI and LXI. ATE maintenance issues and specmanship is also covered. The course then provides a structured approach to test program development in which the students get hands-on experience. Simulation and Automatic Test Pattern Generation (ATPG) is explored. ATE languages, such as ATLAS, are also discussed. Finally, the students are taught how to estimate and manage test engineering resources.

Who should attend:

This course offers an in-depth education in test engineering that is missing from the university curriculum. Every test engineer, whether new to the field or already experienced will greatly benefit from the structured approach this course provides. Anyone dealing with Design for Testability issues will also find this course an important prerequisite. Understanding of Test Engineering problems is probably the best way for a designer to figure out how to make circuits more testable.

Detail:

Course Content:

Introduction

ATE's Historical Development
When to Test. When Not to.
The Test Philosophy

The ATE Introduced

Manual Tester Subsystems
Automatic Tester Subsystems

ATE Selection

Testing Methods

IC Testers
Automatic Optical Inspection (AOI) and X-ray (AXI)
Assembly Fault Testers
Manufacturing Defects Analyzers
Flying Probe Testers
In-Circuit Testers
Boundary-Scan Testers
Functional Testers
Systems Testers
Environmental Test - Burn-In
Field Service Testers

Test Economics

Cost of Testing
Costs of Not Testing
Manual vs. Automatic Testing
Military vs. Commercial ATE
Effect of Fault Distribution
Work Load Analysis
Capacity Calculations
Test Effectiveness
Investment Appraisal Method

Test Strategy Development

Analyzing the UUT
Fault Distribution
Test Stage Mixes
Assessing ATE Requirements
Test Cost Estimation Software

The Test Manager's Role

Test Requirements

Test Specifications
Test Requirements Document (TRD)
Test Requirements Analysis (TRA)
Test Strategy Report (TSR)
Test Program Set (TPS)

Building your ATE

ATE Building Blocks

Stimulus Subsystems
Measuring Subsystems
Routing Subsystems

Introduction to GPIB, HPIB, IEEE 488.1 and 488.2

Introduction to the VXI Bus

Why instrumentation buses?
The IEEE 488 Bus
The VME Bus
Construction of a VXI card
P1 (VME) Connector
P2 & P3 Connector Signals
Local Bus Signals

VXI Plug&Play Alliance

PC-Based Instruments and PXI

Test Executive and Test Software

ATE Maintenance

Upgrading an ATE
ATE Reliability
Sources of ATE Errors

ATE Buy/Build Decision

Digital Test Programming

Functional Board Testing

Stuck-at Fault Models
Fault Detection
Fault Isolation
Path Sensitization

Simulation

The Simulation Model
Good Circuit Simulation vs. Fault Simulation
Fault Scoring
Guided Fault Probing
Fault Dictionary

Analysis Before Coding

Testability Concerns
Timing Considerations
Bus Considerations

Interfacing

Mechanical Interfacing
Electrical Interfacing
Test Adapter Design
Test Adapter Test

The Test Strategy Report (TSR)

Why we need TSRs?
Contents of the TSR
TSR Review Process

Example Test Program

Automatic Test Pattern Generation (ATPG)

When is ATPG useful?
ATPG Techniques
Limitations of ATPG

ATE Languages

Characteristics
Standardization
ATLAS
ATE Language Translation

Analog Testing - Included in a three-day version of the class

Introduction to the Analog World

Measurement Problems
Stimulus Problems
Speed Problems
Automation Problems

Analog Testing

Measurements Criteria
Failure Analysis
Digital Signal Processing
Fixturing Considerations

Analog Fault Isolation

Concept of the Active Element Group (AEG)
In-Circuit Test Methods

Analog Simulation

Using ISPICE
Mathematical Modeling
Tolerances and Accuracies
Analog Automatic Test Generation

Managing Automated Test

Managing Test Resources

TPS Cost Estimation
TPS Acquisition
In-House TPS Development
TPS Quality Assurance
The Test Strategy Report

Managing Various Test Functions

Design for Testability
Production Testing
Software Testing
Maintenance Testing
Field Return Testing
Concurrent Engineering

Instructor: Louis Y. Ungar

Louis Y. Ungar is president of A.T.E. Solutions, Inc., a leading independent test and testability consulting and educational firm. He has taught ATE and Testability courses at the University of California at Los Angeles (UCLA) and throughout industry. Mr. Ungar is a consultant to The American Society of Test Engineers, has served as Testability Chair for the Surface Mount Technology Association and has served on committees for various IEEE standards, including those of IEEE Std. 1149.x. Mr. Ungar holds a B.S.E.E. and Computer Science degree from the UCLA and has completed his course work towards a M.A. in Management.

Availability:
Format	Date	Length	Location	Price
Course Notes				RESERVE NOW RFQ
Onsite				RFQ
Private			Los Angeles	RFQ
Public	2-14-08		Los Angeles, California	$1,495.00 BUY NOW RESERVE NOW RFQ