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| Title: |
Oscilloscopes handle analog, digital, serial signals
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| Author: | EE Times Asia |
| Date: | 8/4/2009 |
| Type: | Product Release |
| Source: |
Tektronix
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| Subjects: | oscilloscope |
| Abstract: |
Tektronix Inc. has introduced a line of mixed-signal oscilloscopes that visualize and analyze analog, digital and serial signals with one instrument. The MSO3000 series offers up to four analog and 16 digital channels, 100MHz to 500MHz bandwidth, 5M...
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| Title: |
LabView takes on software development
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| Author: | Test & Measurement World |
| Date: | 8/4/2009 |
| Type: | Product Release |
| Source: |
National Instruments
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| Subjects: | software test |
| Abstract: |
LabView 2009 adds a host of new toolkits that focus on software design and validation as well as giving you more control over multiple processor cores. Other features focus on wireless signal testing.
Engineers are finding that regulatory agencie...
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| Title: |
SerDes Test Strategies to Minimize EMI/EMC
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| Author: | Tanja Hofner, Auto Electronics |
| Date: | 8/3/2009 |
| Type: | Magazine Article |
| Source: |
Maxim
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| Subjects: | automobile electronics |
| Abstract: |
LCD video displays are becoming more common in automotive applications. Rugged design, small size, and low cost make them ideal for safety systems, navigation, and infotainment applications. As a digital device, the LCD display requires discrete dig...
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| Title: |
Salary Survey - 2009
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| Author: | Test & Measurement World |
| Date: | 8/2/2009 |
| Type: | Report |
| Source: |
Test & Measurement World
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| Subjects: | test engineering |
| Abstract: |
Test & Measurement World conducted the survey by sending an e-mail to subscribers to Test & Measurement World magazine during June 2009. We asked them to tell us about their compensation, experience, education, job satisfaction, and workload. The re...
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| Title: |
LogicVision Reports 2Q Financial Results
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| Author: | Trading Markets.com |
| Date: | 8/2/2009 |
| Type: | Announcement |
| Source: |
LogicVision, Inc.
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| Subjects: | Built-In Self Test (BIST), memory BIST, Built-In Self Repair (BISR) |
| Abstract: |
Second Quarter 2009 Results
Revenues in the second quarter of 2009 were $3.0 million, compared with $3.1 million in the first quarter of 2009.
Net loss in the second quarter of 2009 was $262,000, or $0.03 per share, compared with a net loss ...
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| Title: |
Crosstalk Analysis in High-Speed Serial Links
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| Author: | Pavel Zivny, Tektronix - Evaluation Engineering |
| Date: | 8/1/2009 |
| Type: | Magazine Article |
| Source: |
Tektronix
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| Subjects: | communications test |
| Abstract: |
Timing jitter measurement has dominated high-speed serial link performance metrics for years, but horizontal-axis information gives only half the picture because it cannot account for amplitude distortion caused by crosstalk. By sampling the signal ...
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| Title: |
Testing right from the start
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| Author: | Martin Rowe, Senior Technical Editor -- Test & Measurement World |
| Date: | 8/1/2009 |
| Type: | Magazine Article |
| Source: |
Force 10 Networks
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| Subjects: | test engineering |
| Abstract: |
Engineers at Force10 Networks develop test plans and automation scripts while products are still in development. |
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| Title: |
Teaming up on design and test
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| Author: | Rick Nelson, Chief Editor, Test & Measurement World |
| Date: | 8/1/2009 |
| Type: | Magazine Article |
| Source: |
Test & Measurement World
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| Subjects: | Design for Testability |
| Abstract: |
No longer isolated disciplines, design and test work together, and test tools are taking on design tasks. |
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| Title: |
Top 20 semiconductor companies saw 21% sales surge in Q2
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| Author: | Suzanne Deffree, Managing Editor, News -- Electronic News |
| Date: | 7/31/2009 |
| Type: | Report |
| Source: |
IC Insights
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| Subjects: | semiconductor business |
| Abstract: |
Analysts at IC Insights this week released an encouraging update, reporting that the top 20 semiconductor suppliers averaged a 21% sequential sales increase in Q2, a 37 point swing from the Q1 16% sequential fall averaged for the then top 20 supplie...
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| Title: |
Seeking growth in embedded instrumentation
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| Author: | Test & Measurement World |
| Date: | 7/31/2009 |
| Type: | Interviews and Forums |
| Source: |
ASSET InterTech, Inc.
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| Subjects: | boundary scan, JTAG, microprocessor emulation, embedded instrument |
| Abstract: |
Tim Dehne, until recently a longtime executive with National Instruments, has joined the board of directors of Asset InterTech. Over a career stretching more than 21 years at NI, Dehne led global marketing and R&D at the company, which reported $824...
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| Title: |
Calibrating RF Test Systems With an RF Power Meter
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| Author: | EDN Magazine |
| Date: | 7/23/2009 |
| Type: | Video and Images |
| Source: |
National Instruments
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| Subjects: | power meter RF, calibration |
| Abstract: |
System calibration is critical to the speed and accuracy of your automated test system... In this video, learn how an RF power meter can be used to calibrate insertion loss through a simple RF power measurement. By National Instruments. |
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| Title: |
Pickering introduces two-pole LXI switch matrices
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| Author: | Test & Measurement World |
| Date: | 7/23/2009 |
| Type: | Product Release |
| Source: |
Pickering Interfaces, Ltd.
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| Subjects: | LXI instrumentation, standards |
| Abstract: |
Pickering Interfaces has expanded its 60-550 series of switch matrices with the introduction of two high-density, two-pole EMR (electromechanical relay) LXI switch matrices: the 60-555 512x8 matrix and the 60-556 512x4 matrix. Each unit occupies 1U ...
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| Title: |
What’s Wrong With Engineering Education?
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| Author: | Louis E. Frenzel |
| Date: | 7/22/2009 |
| Type: | Magazine Article |
| Source: |
Electronic Design
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| Subjects: | engineering profession, education |
| Abstract: |
I recently spent a couple of days at the annual conference of the American Society of Engineering Education (ASEE) in Austin, Texas. This event draws roughly 3000 attendees from colleges and universities, mostly from the U.S. While the temperatures ...
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| Title: |
What leading vendors predict
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| Author: | Gail Flower, Contributing Editor -- Test & Measurement World |
| Date: | 7/22/2009 |
| Type: | Interviews and Forums |
| Source: |
Test & Measurement World
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| Subjects: | ATE business |
| Abstract: |
Rick Nelson, editor in chief of Test & Measurement World, moderated a panel of top industry executives as they shared their visions for the semiconductor test industry during the Executive Test Summit held on Tuesday, July 14, during Semicon West 20...
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| Title: |
SEMI reports growth in bookings as book-to-bill ratio improves
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| Author: | Suzanne Deffree, Managing Editor, News -- Electronic News |
| Date: | 7/22/2009 |
| Type: | Report |
| Source: |
SEMI
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| Subjects: | electronics business |
| Abstract: |
North America-based manufacturers of semiconductor equipment posted $323.4 million in orders in June and a book-to-bill ratio of 0.77, according to the June 2009 Book-to-Bill Report published this week by SEMI.
A book-to-bill of 0.77 means that $...
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| Title: |
DAC showing for 'push-button' analog test
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| Author: | Vanessa Knivett, Analog Designline Europe |
| Date: | 7/21/2009 |
| Type: | Magazine Article |
| Source: |
ATEEDA
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| Subjects: | analog BIST |
| Abstract: |
Analog built-in-self-test (BIST) specialist ATEEDA (Edinburgh, Scotland) will be seeking to woo fabless companies at next week's DAC 2009 with an EDA tool that automatically generates HDL or Verilog code to add analog BIST capabilities to mixed sign...
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| Title: |
Cut cost, test time with software-defined A/V test
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| Author: | Ken Ng |
| Date: | 7/21/2009 |
| Type: | Magazine Article |
| Source: |
National Instruments
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| Subjects: | audio video test |
| Abstract: |
A/V devices are now cramped full with modern technologies and multiple functional abilities to support various industry-defined standards to meet the customers' demanding needs. To stay ahead of competition, manufacturers have to innovate to cut dow...
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| Title: |
Building a software test and regression plan
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| Author: | Darryl Koivisto and Deepak Shankar - Evaluation Engineering |
| Date: | 7/20/2009 |
| Type: | Magazine Article |
| Source: |
Embedded.com
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| Subjects: | software test |
| Abstract: |
This article discusses our experience at Mirabilis Design in developing a comprehensive test and support plan. The complexity of the software required that we split the testing into sections- Graphical User Interface, feature library, Documentation,...
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