| Title: |
Andy Grove: How America Can Create Jobs
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| Author: | Andy Grove |
| Date: | 7/1/2010 |
| Type: | Magazine Article |
| Source: |
Business Week
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| Subjects: | employment |
| Abstract: |
The former Intel chief says "job-centric" leadership and incentives are needed to expand U.S. domestic employment again. |
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| Title: |
Accuracy of Pick & Place System Ratings
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| Author: | Phil Zarrow and Jim Hall |
| Date: | 4/2/2010 |
| Type: | Video and Images |
| Source: |
Circuitmart
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| Subjects: | PCB manufacturing |
| Abstract: |
At Board Talk, the Assembly Brothers cut through the marketing hype, the platitudes and incompetent un-scientific baloney with a search for the truth. |
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| Title: |
Solving the Jitter Problem: Free Tutorial
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| Author: | Greg D Le Cheminant |
| Date: | 12/4/2009 |
| Type: | Application Note |
| Source: |
Agilent Technologies, Inc.
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| Subjects: | jitter, clock measurement, signal integrity |
| Abstract: |
Jitter causes bit errors -- and that's not something you can afford in your
devices. So what can you do to handle the jitter problem once and for all?
Download this free tutorial for a better understanding of jitter and how
to solve it, with...
[more] |
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| Title: |
Seica marries flying-probe and boundary-scan test methods
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| Author: | Test & Measurement World |
| Date: | 11/19/2009 |
| Type: | Product Release |
| Source: |
Seica SpA
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| Subjects: | flying probe testers |
| Abstract: |
Seica, in partnership with Temento Systems, has developed the FlyScan module to enable the integration of boundary-scan testing with flying-probe test systems. According to the company, FlyScan exploits the specific benefits of flying-probe and boun...
[more] |
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| Title: |
Free-for-Life Tool Cracks PCB Debug Challenge
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| Author: | Ray Dellecker |
| Date: | 11/11/2009 |
| Type: | Product Release |
| Source: |
JTAG Technologies, Inc.
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| Subjects: | Novel JTAG product available for immediate download |
| Abstract: |
With the breakthrough product family, JTAG Live(tm), debugging boards too crowded for traditional probing becomes a whole lot easier. JTAG Live is ideal for electronics engineers and technicians to use in checking PCBs for basic continuity and corr...
[more] |
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| Title: |
Designing an accessible board
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| Author: | Ron Wilson, Executive Editor -- EDN |
| Date: | 10/8/2009 |
| Type: | Magazine Article |
| Source: |
EDN Magazine
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| Subjects: | Design for Testability |
| Abstract: |
One of the responsibilities of board-level designers is to ensure that verification and failure-analysis engineers have adequate access to signals without resorting to drills, bed-of-nails testers, or focused ion beams. This requirement used to be s...
[more] |
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| Title: |
JTAG Technologies New Express Boundary-scan Controller
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| Author: | Ray Dellecker |
| Date: | 9/29/2009 |
| Type: | Product Release |
| Source: |
JTAG Technologies, Inc.
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| Subjects: | New Express Boundary-Scan Controller |
| Abstract: |
JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, announces a further extension of its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT...
[more] |
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| Title: |
Product Release
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| Author: | Ray Dellecker |
| Date: | 9/15/2009 |
| Type: | Product Release |
| Source: |
JTAG Technologies, Inc.
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| Subjects: | JTAG Test Routines Bend the Coverage Curve |
| Abstract: |
Test engineers have a new weapon in the battle to verify the operation of complex, non-boundary-scan clusters. In addition to its ActiveTest tool, JTAG Technologies now offers JTAG Functional Test (JFT)simplifying test preparation and interpretatio...
[more] |
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| Title: |
GOEPEL electronics to run Webinars on JTAG/Boundary Scan in October
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| Author: | GÖPEL electronic |
| Date: | 9/8/2009 |
| Type: | Announcement |
| Source: |
GOEPEL electronic
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| Subjects: | JTAG, Boundary Scan, IEEE 1149.1, basics, webinar, scan test |
| Abstract: |
GOEPEL electronics, vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, will run free Webinars on the four Tuesdays in October 2009. The company, based in Austin, TX, will present information on topics such as the basics of JTAG/B...
[more] |
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| Title: |
GOEPEL electronics to run another Technology Day in UK
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| Author: | GOEPEL electronic |
| Date: | 9/8/2009 |
| Type: | Announcement |
| Source: |
GOEPEL electronic
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| Subjects: | JTAG, Boundary Scan, UK, Technology Day, AOI, Automated Inspection |
| Abstract: |
GOEPEL electronics Ltd, a leader in JTAG/Boundary Scan and AOI/AXI systems, will run another Technology Day in the UK on the 13th October 2009 in Southampton. The seminars will be covering latest developments and applications in JTAG/Boundary Scan a...
[more] |
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| Title: |
TDR Impedance Measurements: A Foundation for Signal Integrity
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| Author: | Tektronix |
| Date: | 8/15/2009 |
| Type: | Application Note |
| Source: |
Tektronix
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| Subjects: | signal integrity |
| Abstract: |
At today’s high operating frequencies, anything that affects your signal’s rise time, pulse width, timing, jitter or noise content can impact reliability at the system level. Mismatches and variations can cause reflections that decrease your signal ...
[more] |
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| Title: |
Testing Modern Radios
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| Author: | Tektronix |
| Date: | 8/15/2009 |
| Type: | Application Note |
| Source: |
Tektronix
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| Subjects: | RF test, telecommunications test |
| Abstract: |
Designers have long sought to improve the performance and resiliency of radio
communications. With the radio frequency (RF) spectrum becoming more
crowded and interference more prevalent in recent years, these efforts have
become increasingly cri...
[more] |
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| Title: |
Seica SpA launches brand new bare board flying probe system
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| Author: | EMSNow |
| Date: | 8/12/2009 |
| Type: | Product Release |
| Source: |
Seica SpA
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| Subjects: | flying probe testers |
| Abstract: |
Seica SpA, a manufacturer of Automatic Test Equipment (ATE) and laser-based selective soldering systems, has now announced the latest addition to its new generation of flying probe test systems. Seica's innovative test solutions are being used acros...
[more] |
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| Title: |
Geotest Announces Opening of Online Store
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| Author: | Geotest |
| Date: | 8/11/2009 |
| Type: | Announcement |
| Source: |
Geotest
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| Subjects: | test instruments business |
| Abstract: |
As part of a comprehensive enhancement of the company’s corporate website, Geotest-Marvin Test Systems, Inc. has added an online buying function to support the purchase of Geotest products on the Web. Customers are now able to view and purchase the ...
[more] |
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| Title: |
Audio test set handles Bluetooth products
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| Author: | Test & Measurement World |
| Date: | 8/5/2009 |
| Type: | Product Release |
| Source: |
Anritsu Corporation
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| Subjects: | audio test |
| Abstract: |
Anritsu has introduced the MT8855A integrated test set, which the company claims is the first dedicated Bluetooth audio test set. The instrument is aimed at products that use the Bluetooth A2DP (Advanced Audio Distribution Profile), headset profile,...
[more] |
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